Reliability & Lifetime Prediction of GaN Devices - Solsta

Map Unavailable

Date(s) - 25/05/2021
11:00 am - 12:00 pm



We are hosting a series of free GaN Power Design webinars with Efficient Power Conversion (EPC) starting from 11th May 2021.


EPC webinars exhibit over 60 years of combined experience in advanced power management technology. From understanding critical design aspects to GaN power device reliability to identifying the value of GaN, EPC webinars help engineers in their next design and understand the nutshell advantages of GaN.


The webinars cover GaN Power Design in suitable applications such as automotive systems, motor drives, medical, satellites and high-density computing.


Reliability & Lifetime Prediction of GaN Devices

Study based on the newly published report


Thirty years of silicon power MOSFET development taught us that one of the key variables controlling the adoption rate of a disruptive technology is whether or not the product is reliable enough to use in the application. This principle has guided the design of EPC’s enhancement mode Gallium Nitride devices. EPC has performed reliability testing demonstrating that the technology is ready for commercial use. This video describes the reliability tests performed and the results achieved.


Why GaN Video Series: Reliability of GaN Devices



At the end of each session, there will be an opportunity for Q&As. However, to ensure your question will be covered efficiently, feel free to submit your quesitons in the ‘comment’ section below before the webinar or email



Bookings are closed for this event.