Why GaN is More Robust than Silicon Power MOSFETs with EPC

Date(s) - 06/05/2020
6:00 pm - 7:00 pm



Introducing a series of ‘How to GaN’ free webinars brought to you by Efficient Power Conversion (EPC).


Join EPC CEO & Co-Founder, Alex Lidow on the first webinar to discover the critical aspects of gallium nitride (GaN) power device reliability and how testing GaN devices to failure demonstrates robustness unmatched by silicon power MOSFETs.


**In this webinar you will learn the following:

  • How the key mechanisms impacting dynamic RDS(on) have been identified and used to create more robust designs
  • How several eGaN® products were tested exhaustively throughout their data sheet safe operating area (SOA), and then taken to failure to probe the safety margins
  • How eGaN devices are tested to destruction under short-circuit conditions to determine how long and what energy density they withstand before catastrophic failure
  • How EPC developed a custom system to assess eGaN reliability over long-term lidar pulse stress conditions


Click here to register for free


Please note: the webinar will be recorded for those who cannot attend however you must register before the event.